Thin film metrology
Spectroscopic ellipsometers
SENresearch - UV-VIS-NIR spectroscopic ellipsometer family
SENpro - cost effective spectroscopic ellipsometer
SENDIRA - infrared spectroscopic ellipsometer
Laser ellipsometers und CER
SE 400adv - multiple angle laser ellipsometer
SE 500adv - combined ellipsometry and reflectometry CER
The SENDURO® represents a family of spectroscopic ellipsometers for industrial quality control featuring automatic sample alignment and recipe oriented operation.
SE 300
The SE 300 is a highly specialized handheld laser ellipsometer that measures the protective coating on curved aluminum automotive reflectors.
The laser ellipsometer measures thickness and refractive index of anti-reflection and passivation layers on textured multicrystalline and monocrystalline solar cells.
FTPadv Inline
The SE 800 PV is a highly specialized ellipsometer for the analysis of single or multiple layers on textured monocrystalline and multicrystalline silicon solar cells.
The reflectometer measures the thickness of antireflective films on monocrystalline and multicrystalline silicon solar cells.
The multiple sensor platform is manually moved over thin film solar cells on a tabletop system.
Panel size: 1.1 m x 1.6 m, 1.1 m x 1.4 m, others on request
Sensors for:
- Reflection measurements on smooth and rough films
- Non-contact sheet resistance measurement (Eddy current method)
- 4-point probe sheet resistance measurement
The computer controlled horizontal mapping system moves a multiple sensor platform to map thin film solar cell.
Panel size: max 2.2 m x 2.6 m
Sensors for:
- haze, spectrally resolved haze measurement
- reflection measurements on smooth and rough films
- transmission measurements on smooth and rough films
- non-contact sheet resistance measurement (eddy current method)
- 4-point probe sheet resistance measurement
The computer controlled vertical mapping system measures thin film solar cells featuring a fixed sensor platform.
Panel size: 1.1 m x 1.6 m, 1.1 m x 1.4 m, others on request
Sensors for:
- haze, spectrally resolved haze measurement
- reflection measurements on smooth and rough films
- transmission measurements on smooth and rough films
- non-contact sheet resistance measurement (eddy current method)
- 4-point probe sheet resistance measurement