Freiberg Instruments products

MDP

Microwave Detected Photoconductivity

  • Characterizing microelectronic and photovoltaic silicon
    • Mapping carrier lifetime
    • Mapping photoconductivity
  • Measuring technics
    • µ-PCD by variable, short intensive laser pulse
    • Measuring carrier lifetime at steady state condition
    • LBIC (optional)

    • Measuring resistivity by eddy current

 

Carrier lifetime measurement systems

  • MDP MAP           wafer mapping system
  • MDP SPOT        tabletop single spot measurement system

  • MDP INGOT      ingot and wafer mapping system

     

     

 

  • MDP INLINE               inline wafer mapping system, one wafer
    .                                     image ( 2d) in one second

  • MDP LINESCAN        inline spot measurement system (line scan)
  • MDP INLINE INGOT  ingot inline block mapping system